TOPOGRAPHICAL ARTIFACTS AND OPTICAL RESOLUTION IN NEAR-FIELD OPTICAL MICROSCOPY

Authors
Citation
Si. Bozhevolnyi, TOPOGRAPHICAL ARTIFACTS AND OPTICAL RESOLUTION IN NEAR-FIELD OPTICAL MICROSCOPY, Journal of the Optical Society of America. B, Optical physics, 14(9), 1997, pp. 2254-2259
Citations number
26
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Optics
ISSN journal
0740-3224
Volume
14
Issue
9
Year of publication
1997
Pages
2254 - 2259
Database
ISI
SICI code
0740-3224(1997)14:9<2254:TAAORI>2.0.ZU;2-J
Abstract
Starting from general principles of near-field optical microscopy, I d emonstrate that an optical image obtained with any near-field microsco pe operating in a constant (probe-surface) distance mode contains pure topographical artifacts, topographically induced features, and pure o ptical contrast. Scanning a sharp topographical step at an otherwise h omogeneous sample surface is shown to provide a sensitivity window tha t determines the scale on which the near-field optical image would rep resent mostly pure optical contrast. I suggest that the sensitivity wi ndow can be regarded as the upper limit of optical resolution of a nea r-field microscope. (C) 1997 Optical Society of America.