N. Suehira et al., Low-temperature noncontact atomic-force microscope with quick sample and cantilever exchange mechanism, REV SCI INS, 72(7), 2001, pp. 2971-2976
We present the design and performance of a noncontact atomic-force microsco
pe (AFM) operating at low temperatures (LTNCAFM). For the first time, a "to
p bath" cryostat is used to avoid long-distance translation of the AFM unit
, while protecting the fragile optical fiber, and to reduce outgassing. The
top bath cryostat is optimized by using three radiation shields with two s
hutters. The AFM unit is cooled down to 5 K for 14 h with 4.6 l liquid heli
um. The quick sample and cantilever exchange is performed even at low tempe
ratures. The optimal positioning of the optical fiber with respect to a can
tilever can be performed with a three-dimensional micropositioner within 10
min. The high performance of the LTNCAFM is demonstrated with an atomicall
y resolved image of a Si(111)7x7 surface. (C) 2001 American Institute of Ph
ysics.