Low-temperature noncontact atomic-force microscope with quick sample and cantilever exchange mechanism

Citation
N. Suehira et al., Low-temperature noncontact atomic-force microscope with quick sample and cantilever exchange mechanism, REV SCI INS, 72(7), 2001, pp. 2971-2976
Citations number
27
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
0034-6748 → ACNP
Volume
72
Issue
7
Year of publication
2001
Pages
2971 - 2976
Database
ISI
SICI code
0034-6748(200107)72:7<2971:LNAMWQ>2.0.ZU;2-4
Abstract
We present the design and performance of a noncontact atomic-force microsco pe (AFM) operating at low temperatures (LTNCAFM). For the first time, a "to p bath" cryostat is used to avoid long-distance translation of the AFM unit , while protecting the fragile optical fiber, and to reduce outgassing. The top bath cryostat is optimized by using three radiation shields with two s hutters. The AFM unit is cooled down to 5 K for 14 h with 4.6 l liquid heli um. The quick sample and cantilever exchange is performed even at low tempe ratures. The optimal positioning of the optical fiber with respect to a can tilever can be performed with a three-dimensional micropositioner within 10 min. The high performance of the LTNCAFM is demonstrated with an atomicall y resolved image of a Si(111)7x7 surface. (C) 2001 American Institute of Ph ysics.