ZnCdSe/ZnMgSe and ZnSe/ZnMgBeSe distributed Bragg reflectors have been grow
n on ZnSe (1 0 0) substrates by molecular beam epitaxy. Optical and structu
ral properties were investigated. A calculation was applied to the design o
f II-VI DBRs on ZnSe substrates. The comparison of theoretical and experime
ntal reflectivity spectra proposes that the discrepancy of maximum reflecta
nce is related to the heterointerface roughness in the non-pseudomorphic sy
stem. For the ZnCdSe/ZnMESe system, DBRs contained 10.5 and 20 stacks of al
ternated quarter-wavelength layers were obtained. The maximum reflectance w
as around 80% at 560 nm for 20 pairs of Zn0.86Cd0.14Se/Zn0.79Mg0.21Se. The
ZnSe/ZnMgBeSe DBR structures show the abrupt heterointerface and good smoot
hness of surface. The 12 pairs of ZnSe/Zn0.72Mg0.21 Be0.07Se quarter-wavele
ngth layers were deposited and maximum reflectance was at 605 nm. The peak
position and reflectance correlate well with theoretical prediction. (C) 20
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