Analysis of fluorescent and Raman spectra with spatial resolution (depth analysis) method

Citation
Xx. Xu et al., Analysis of fluorescent and Raman spectra with spatial resolution (depth analysis) method, J INF M W, 20(3), 2001, pp. 169-173
Citations number
6
Language
CHINESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF INFRARED AND MILLIMETER WAVES
ISSN journal
1001-9014 → ACNP
Volume
20
Issue
3
Year of publication
2001
Pages
169 - 173
Database
ISI
SICI code
1001-9014(200106)20:3<169:AOFARS>2.0.ZU;2-P
Abstract
A depth analysis spectra method for researching fluorescent and Raman spect ra was developed since a self-absorption was often observed in fluorescent spectra of thick solid sample. The intensity change of self-absorption coul d be observed to explore the secrets of solid state spectra by depth analys is method. The Raman and fluorescent spectra of Nd3+:YAG crystal were measu red with 633nm of HN laser and 514. 5nm of Ar+ laser. Some fluorescent line s which possess self-absorption were observed, whose intensity changes with depth of confocal plane. It shows that spatial resolution (depth analysis) method is a powerful experimental means for studying solid state spectrosc opy.