Carrier activation in in situ Si-doped GaAs layers fabricated by a focusedSi ion beam and molecular beam epitaxy combined system

Citation
T. Hada et al., Carrier activation in in situ Si-doped GaAs layers fabricated by a focusedSi ion beam and molecular beam epitaxy combined system, NUCL INST B, 175, 2001, pp. 751-755
Citations number
7
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168-583X → ACNP
Volume
175
Year of publication
2001
Pages
751 - 755
Database
ISI
SICI code
0168-583X(200104)175:<751:CAIISS>2.0.ZU;2-7
Abstract
C-V carrier profiles for 200 eV and 30 keV Si FIB singly and doubly implant ed and successively buried regions in GaAs using a FIB/MBE combined system were investigated to show a possibility of formation of doping layer above the 30 keV Si-implanted region which is desirable for formation of three-di mensional semiconductor nano-structures. It is found that carrier density i n the 30 keV Si implanted and buried region was reduced near the projected range and the doping efficiency was less than half of that in samples fabri cated by implantation without the successive burying after post-annealing. For the 200 eV and 30 keV doubly implanted sample, the peak carrier density for 200 eV Si was reduced by 40% compared with 200 eV single implantation, The present result suggests that large amount of damage may be remained in the implanted range and the post-annealing was less effective in the burie d sample because of the existence of the overlayer-regrown cap layer. (C) 2 001 Elsevier Science B.V. All rights reserved.