Comparison of microstructure and ferroelectric properties of alkoxy-derived MBi4Ti4O15 (M : Ca or Sr) thin films

Citation
K. Kato et al., Comparison of microstructure and ferroelectric properties of alkoxy-derived MBi4Ti4O15 (M : Ca or Sr) thin films, JPN J A P 1, 40(9B), 2001, pp. 5580-5584
Citations number
10
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
9B
Year of publication
2001
Pages
5580 - 5584
Database
ISI
SICI code
0021-4922(200109)40:9B<5580:COMAFP>2.0.ZU;2-6
Abstract
CaBi4Ti4O15 (CBTi144) and SrBi4Ti4O15 (SBTi144) thin films were prepared on Pt-passivated silicon substrate using complex metal alkoxide solutions. Th e CBTi144 thin films crystallized to a single phase of perovskite at 650 de greesC via a mixture of perovskite and pyrochlore phases. The 650 degreesC- annealed CBTi144 thin films consisted of uniform and isotropic grains and h ad a closely packed columnar structure. In contrast, the SBTi144 thin films crystallized to the perovskite phase at relatively lower temperature and c onsisted of smaller and non-uniform grains. The dielectric constants and lo ss factors of the 650 degreesC-annealed CBTi144 and SBTi144 thin films were 300 and 0.03, and 330 and 0.04, respectively, at 100 kHz. The remanent pol arizations and coercive electric fields were 6.0 muC/cm(2) and 79 kV/cm, an d 2.9 muC/cm(2) and 55 kV/cm, respectively, at 9 V. The dielectric and ferr oelectric, properties depended on both the cation size in the A site and th e microstructure.