Interferometric characterization of spatial coherence of high energy synchrotron X-rays

Citation
V. Kohn et al., Interferometric characterization of spatial coherence of high energy synchrotron X-rays, OPT COMMUN, 198(4-6), 2001, pp. 293-309
Citations number
40
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS COMMUNICATIONS
ISSN journal
0030-4018 → ACNP
Volume
198
Issue
4-6
Year of publication
2001
Pages
293 - 309
Database
ISI
SICI code
0030-4018(20011101)198:4-6<293:ICOSCO>2.0.ZU;2-T
Abstract
A simple and direct interferometric technique for characterization of the s ource size and the transverse coherence length of synchrotron hard X-rays i s discussed. A high level of spatial coherence of the X-ray beam allows us to detect the diffraction images (phase contrast patterns) of both the boro n fiber of about 100 mum diameter and the slit of different widths. We char acterize the level of coherence by comparison of the measured visibility of the interference fringes with the theoretical values by means of simple an alytical formulas derived in this work. The analytical theory of both the f iber and the slit diffraction images is discussed in details. The results o btained analytically are confirmed by computer simulations. The proposed te chnique is well suited for third-generation synchrotron sources and was app lied at the European Synchrotron Radiation Facility. (C) 2001 Elsevier Scie nce B.V. AM rights reserved.