Results of radiation test of the cathode front-end board for CMS endcap muon chambers

Citation
R. Breedon et al., Results of radiation test of the cathode front-end board for CMS endcap muon chambers, NUCL INST A, 471(3), 2001, pp. 340-347
Citations number
3
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
0168-9002 → ACNP
Volume
471
Issue
3
Year of publication
2001
Pages
340 - 347
Database
ISI
SICI code
0168-9002(20011001)471:3<340:RORTOT>2.0.ZU;2-G
Abstract
After a brief overview of the CMS EMU electronics system, results on radiat ion induced single event effects, total ionization dose and displacement ef fects will be reported. These results are obtained by irradiating the compo nents on electronics boards with 63 MeV protons and I MeV neutrons. During the proton irradiation, the electronics board was fully under power, all co mponents on the board were active and the data were read out in the same wa y as designed for CMS. No deterioration of analog performance for each of t he three CMOS ASICs on the tested board was observed, up to a dose of 10 kr ad. Each of the tested FPGAs survived beyond the dose of 30 krad. No single event latch-up was detected for the CMOS ASICs up to a proton fluence of 2 x 10(12) cm(-2). Single Event Upsets (SEU) in FPGAs were detected and thei r cross-sections measured. SEU mitigation with triple module redundancy and voting was implemented and tested. (C) 2001 Elsevier Science B.V. All righ ts reserved.