Ion electron emission microscopy at the SIRAD single event effect facility

Citation
D. Bisello et al., Ion electron emission microscopy at the SIRAD single event effect facility, NUCL INST B, 181, 2001, pp. 254-257
Citations number
10
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168-583X → ACNP
Volume
181
Year of publication
2001
Pages
254 - 257
Database
ISI
SICI code
0168-583X(200107)181:<254:IEEMAT>2.0.ZU;2-0
Abstract
The SIRAD facility at the 15 MV Tandem accelerator of the INFN Leggnaro Lab oratory is dedicated to characterizing the global sensitivity of electronic devices and systems to single event effects (SEE) due to ion impacts over a wide range of linear energy transfer. To map out device sensitivity with micrometric resolution, an ion electron emission microscope will be used to localize the impact point of each ion, with spatial resolution better than I kin, by imaging the secondary electrons emitted by the device. A fast po sition sensitive detector will handle rates > 10(4) Hz. The system will be fully ion-impact reconstruction efficient for ions with Z greater than or e qual to 8. (C) 2001 Elsevier Science B.V. All rights reserved.