Reliability tests of the MR head in helical-scan tape systems

Citation
Y. Soda et al., Reliability tests of the MR head in helical-scan tape systems, IEEE MAGNET, 37(4), 2001, pp. 1716-1718
Citations number
3
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON MAGNETICS
ISSN journal
0018-9464 → ACNP
Volume
37
Issue
4
Year of publication
2001
Part
1
Pages
1716 - 1718
Database
ISI
SICI code
0018-9464(200107)37:4<1716:RTOTMH>2.0.ZU;2-G
Abstract
In a helical-scan tape system, the MR head is brought into contact with the tape surface at high speed and is exposed to the atmosphere without a prot ective coating. In this paper, we study the contact resistance between the MR. head and tape in terms of tape surface resistance and voltage applied t o the head. The electrostatic charge that accumulates on the tape surface a s a result of running the tape was measured and found to be less than a few volts. Corrosion tests were found to cause no electrical damage and no vis ual change, and the block error rate remained constant after storage for 1 year and 5 months. We conclude that helical scan tape systems using the MR head are reliable [1], [2].