Setup and application of scanning near-field optical microscopy

Citation
Sf. Xu et al., Setup and application of scanning near-field optical microscopy, CHIN PHYS, 10, 2001, pp. S195-S205
Citations number
14
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Physics
Journal title
CHINESE PHYSICS
ISSN journal
1009-1963 → ACNP
Volume
10
Year of publication
2001
Supplement
S
Pages
S195 - S205
Database
ISI
SICI code
1009-1963(200107)10:<S195:SAAOSN>2.0.ZU;2-Q
Abstract
The research on the setup and application of scanning near-field optical mi croscopy (SNOM) performed in our laboratory is reviewed in this report. We have constructed a versatile low temperature scanning near-field optical mi croscope with the capability of near-field imaging and spectroscopy, operat ing at liquid nitrogen temperature. A special designed coaxial double lens was used to introduce the illumination beam through a 200 mum fiber; the de tected optical signal was transmitted via a fiber tip to an avalanche photo n detector. The performance test shows the stability of the new design. The shear force image and optical image of a standard sample are shown. A syst em of SNOM working at room temperature and atmosphere was used to character ize semiconductors and bio-molecular samples. It revealed the unique featur es of semiconductor microdisks in the near-field that is significantly diff erent from that of far-field. The effects of different geographic microstru ctures on the near-field light distribution of InGaP, GaN, and InGaN multi- quantum-well microdisk were observed.