Propagation characteristics of ultrahigh-Delta optical waveguide on silicon-on-insulator substrate

Citation
A. Sakai et al., Propagation characteristics of ultrahigh-Delta optical waveguide on silicon-on-insulator substrate, JPN J A P 2, 40(4B), 2001, pp. L383-L385
Citations number
8
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
4B
Year of publication
2001
Pages
L383 - L385
Database
ISI
SICI code
0021-4922(20010415)40:4B<L383:PCOUOW>2.0.ZU;2-3
Abstract
A submicron rectangular waveguide with a relative refractive index differen ce Delta of 45% was fabricated on a silicon-on-insulator substrate, and its propagation characteristics were evaluated using the Fabry-Perot resonance method. The propagation loss was of the order of 10 cm(-1), and was domina ted by light scattering at rough interfaces, However, a large modal effecti ve index of more than 4.5 and a low bend loss of less than I dB at a 0.5-mu m-radius bend were also observed. These results suggest the potential of an ultrasmall and high-density lightwave circuit, which accepts the relativel y large propagation loss.