Kelvin probe force microscopy imaging using carbon nanotube probe

Citation
S. Takahashi et al., Kelvin probe force microscopy imaging using carbon nanotube probe, JPN J A P 1, 40(6B), 2001, pp. 4314-4316
Citations number
5
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
6B
Year of publication
2001
Pages
4314 - 4316
Database
ISI
SICI code
0021-4922(200106)40:6B<4314:KPFMIU>2.0.ZU;2-J
Abstract
We have measured the potential profiles of the contact potential difference (CPD) between Al-evaporated substrates and dispersed carbon nanotubes (CNT s) by Kelvin probe force microscopy (KFM) using both a conventional Au-coat ed Si (Au-Si) probe and a CNT probe. The lateral resolutions of both topogr aphy and the potential distribution image were improved by using the CNT pr obe. The CPD has been measured for CNTs with various diameters. We observed that the CPD increases with an increase in the diameter. This indicates th at the work function of CNTs increases with an increase in the diameter.