Nanoscale investigation of hydrogen-induced degradation mechanism in Pt/(Pb, La)(Zr, Ti)O-3/Pt capacitors

Citation
C. Yoshida et al., Nanoscale investigation of hydrogen-induced degradation mechanism in Pt/(Pb, La)(Zr, Ti)O-3/Pt capacitors, APPL PHYS L, 79(9), 2001, pp. 1339-1341
Citations number
14
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
0003-6951 → ACNP
Volume
79
Issue
9
Year of publication
2001
Pages
1339 - 1341
Database
ISI
SICI code
0003-6951(20010827)79:9<1339:NIOHDM>2.0.ZU;2-8
Abstract
The effects of hydrogen on Pt/(Pb, La)(Zr, Ti)O-3(PLZT)/Pt capacitors have been investigated using atomic force microscopy piezoelectric measurements. The study revealed that the capacitors consist of submicron-sized ferroele ctric domains, which were randomly distributed at positive or negative rema nent states. After hydrogen annealing, it was observed that the local piezo electric hysteresis loops of each domain shifted along both the voltage axi s and the polarization axis. The degradation of remanent polarization can b e explained by the shifted hysteresis of each domain. The degradation of sa turation polarization can be understood to have been caused by the nonswitc hing portion within the capacitor. (C) 2001 American Institute of Physics.