As-Sb compositional intermixing was studied by transmission electron micros
copy (TEM) in GaAs films grown by molecular-beam epitaxy at low temperature
(LT) and delta doped with antimony. The TEM technique was calibrated by im
aging the as-grown films with delta layers containing various amounts of Sb
. The calibration allowed us to deduce the effective As-Sb interdiffusion c
oefficient from apparent thickness of the Sb delta layers in the films subj
ected to isochronal anneals at 400-600 degreesC. The As-Sb intermixing in L
T GaAs was found to be much enhanced when compared to conventional material
. Its temperature dependence yields a diffusion coefficient of DAs-Sb=2x10(
-14) exp(-0.62 +/-0.15 eV/kt) cm(2) s(-1). Since the kick-out mechanism ope
rating under equilibrium conditions is valid for As-Sb interdiffusion in Ga
As, the enhanced intermixing was attributed to an oversaturation of arsenic
self-interstitials in the LT GaAs films. The effective activation energy f
or As-Sb interdiffusion in LT GaAs seems to be reasonably close to the migr
ation enthalpy of As interstitials, whereas their concentration was roughly
estimated as 10(18) cm(-3). (C) 2001 American Institute of Physics.