The current-carrying capacity and reliability studies of multiwalled carbon
nanotubes under high current densities (> 10(9) A/cm(2)) show that no obse
rvable failure in the nanotube structure and no measurable change in the re
sistance are detected at temperatures up to 250 degreesC and for time scale
s up to 2 weeks. Our results suggest that nanotubes are potential candidate
s as interconnects in future large-scale integrated nanoelectronic devices.
(C) 2001 American Institute of Physics.