Evaluation of adhesion and wear durability of ultrathin films by atomic force microscopy

Authors
Umemura, S Hirano, S Andoh, Y Kaneko, R
Citation
S. Umemura et al., Evaluation of adhesion and wear durability of ultrathin films by atomic force microscopy, J JPN SOC T, 46(6), 2001, pp. 439-446
Citations number
7
Language
GIAPPONESE
art.tipo
Article
Categorie Soggetti
Mechanical Engineering
Journal title
JOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS
ISSN journal
0915-1168 → ACNP
Volume
46
Issue
6
Year of publication
2001
Pages
439 - 446
Database
ISI
SICI code
0915-1168(2001)46:6<439:EOAAWD>2.0.ZU;2-3