Recording at the nanometer scale on p-nitrobenzonitrile thin films by scanning tunneling microscopy

Citation
Dx. Shi et al., Recording at the nanometer scale on p-nitrobenzonitrile thin films by scanning tunneling microscopy, ADVAN MATER, 13(14), 2001, pp. 1103
Citations number
27
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Multidisciplinary,"Material Science & Engineering
Journal title
ADVANCED MATERIALS
ISSN journal
0935-9648 → ACNP
Volume
13
Issue
14
Year of publication
2001
Database
ISI
SICI code
0935-9648(20010718)13:14<1103:RATNSO>2.0.ZU;2-3
Abstract
A data storage density of at least 10(14) bits/cm(2) is possible using p-ni trobenzonitrile as the data storage medium and scanning tunneling microscop y (STM) as the recording method. This represents the smallest mark size amo ng all the organic thin films studied by these authors. The figure shows a typical STM image of a recorded pattern.