Thin films of the organic semiconductor copper phthalocyanine (CuPc) have b
een grown on the InSb(1 1 1)A 2 x 2 surface by organic molecular beam depos
ition (OMBD). Soft X-ray photoelectron spectroscopy (SXPS) using synchrotro
n radiation, low energy electron diffraction (LEED) and Raman spectroscopy
have been applied to monitor the bonding and energy band line-up at the CuP
c-InSb interface. LEED shows that the first layer of CuPc is ordered. SXPS
data reveal that the chemical interaction between the overlayer and the sub
strate is limited. The lineshapes of the shallow In and Sb core levels chan
ge very little during the growth of the CuPc film. Emission from the valenc
e states of both InSb and CuPc was also monitored and the valence band offs
et for this hybrid system was determined to be (0.75 +/- 0.14) eV. Raman sp
ectroscopy confirms the limited interaction at the junction and further rev
eals that the structure of the CuPc film changes with increasing thickness.
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