Transmission electron microscopy (TEM) of silicate glasses containing CdSxSe1-x

Authors
Citation
P. Mukherjee, Transmission electron microscopy (TEM) of silicate glasses containing CdSxSe1-x, J MAT SCI L, 20(7), 2001, pp. 605-609
Citations number
25
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE LETTERS
ISSN journal
0261-8028 → ACNP
Volume
20
Issue
7
Year of publication
2001
Pages
605 - 609
Database
ISI
SICI code
0261-8028(2001)20:7<605:TEM(OS>2.0.ZU;2-7