Photoacoustic spectroscopy of semiconductor powders and thin films

Citation
J. Bernal-alvarado et M. Vargas-luna, Photoacoustic spectroscopy of semiconductor powders and thin films, ANAL SCI, 17, 2001, pp. S309-S311
Citations number
8
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ANALYTICAL SCIENCES
ISSN journal
0910-6340 → ACNP
Volume
17
Year of publication
2001
Pages
S309 - S311
Database
ISI
SICI code
0910-6340(2001)17:<S309:PSOSPA>2.0.ZU;2-Q
Abstract
We used the open cell photoacoustic technique to obtain the photoacoustic s ignal (PAS) of a CdTe thin film (grown over an slide of glass), we measured its effective thermal diffusivity of the system, the surface recombination velocities of the charge carriers and the recombination time in the bulk W e also studied semiconductor samples made from powders of RuTe, RuS, RuSe2 and CdTe. This materials were compressed to form circular and flat pellets and in this way, they where attached at The sound inlet of an electrect mic rophone. We measured thermal and electronic transport parameters of such ma terials. The analysis used the amplitude and phase data of the PAS, and fit ted the theoretical model for PA spectroscopy of semiconductor, in the OCP technique (Pinto-Neto and Dramicanin), taking in account that the samples w ere opaque and thermally thick.