Study of proton irradiation induced CVD diamond priming by lateral micro-ion beam induced charge technique

Citation
R. Lu et al., Study of proton irradiation induced CVD diamond priming by lateral micro-ion beam induced charge technique, MATER RES B, 36(1-2), 2001, pp. 47-55
Citations number
8
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS RESEARCH BULLETIN
ISSN journal
0025-5408 → ACNP
Volume
36
Issue
1-2
Year of publication
2001
Pages
47 - 55
Database
ISI
SICI code
0025-5408(200101)36:1-2<47:SOPIIC>2.0.ZU;2-I
Abstract
Lateral micro-ion beam induced charge (IBIC) is a powerful method to charac terize the electrical behavior of chemical vapor deposition (CVD) diamond t hin film and further to evaluate its quality. In the process of IBIC data h andling, a new model that the product of mobility and lifetime linearly inc reases from substrate side to growth side was proposed in order to separate ly analyze the carriers' contributions to charge collection efficiency. IBI C results shows that CVD diamond was primed by irradiation of 46 Gy proton dose with a 82.4% increase of average collection distance due to the space charge elimination inside the CVD diamond after irradiation. (C) 2001 Elsev ier Science Ltd. All rights reserved.