Magnetoresistance of Lao(0.7)Sr(0.3)MnO(3) thin films grown on polycrystalline MgO substrates

Citation
I. Satoh et T. Kobayashi, Magnetoresistance of Lao(0.7)Sr(0.3)MnO(3) thin films grown on polycrystalline MgO substrates, JPN J A P 1, 40(2A), 2001, pp. 586-591
Citations number
10
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
2A
Year of publication
2001
Pages
586 - 591
Database
ISI
SICI code
0021-4922(200102)40:2A<586:MOLTFG>2.0.ZU;2-N
Abstract
In this study, the intergrain magnetoresistance (IMR) of La0.7Sr0.3MnO3 (LS MO) thin films at 77 K and the IMR's deposition temperature (T-d) dependenc e were examined. All LSMO films were grown on the polycrystalline MgO subst rate (40-60 mum grain size) by the Ar-F excimer laser ablation (pulsed lase r deposition) method. The T-d'S ranged from 450 to 600 degreesC. Due to a l arge lattice mismatch between LSMO and MgO, LSMO film grows in the shape of column with a (110) axis. On the substrate grain boundary, LSMO forms a ti lted nanocolumn boundary, which produces a large IMR effect. Then exists an optimum T-d (similar to 500 degreesC) which provides the LSMO film with th e largest IMR. Below and above this temperature, IMR decreases monotonicall y with decreasing, and increasing of T-d. This is due to an antithetical T- d dependence of the boundary definition against the column crystallinity.