Side-extraction-type secondary emission electron gun using wire ion plasmasource

Citation
Pr. Chalise et al., Side-extraction-type secondary emission electron gun using wire ion plasmasource, JPN J A P 1, 40(2B), 2001, pp. 1118-1121
Citations number
5
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
2B
Year of publication
2001
Pages
1118 - 1121
Database
ISI
SICI code
0021-4922(200102)40:2B<1118:SSEEGU>2.0.ZU;2-F
Abstract
A secondary emission electron gun applicable for gas treatment was designed , fabricated and tested. The gun is set beside an ion source, which is call ed a wire ion plasma source (WIPS). Ions extracted from WIPS are accelerate d toward the cathode surface, which is set oblique to the ion loci. Seconda ry electrons emitted from this cathode surface by the collision of ions are then accelerated toward the electron window and form a very wide electron beam. The electron window is set orthogonal to the ion extraction window an d has earth potential. In order to inject the electron beam perpendicular t o the electron window, the ion and electron trajectories were numerically s imulated for several conditions. A wide electron-beam current distribution was observed inside the gas treatment chamber when a honeycomb board and an Al film were placed at the electron window. The electron-beam current dens ity of 6.4 mA/cm(2) measured at the cathode voltage of 80 kV possesses suff icient energy to irradiate gaseous pollutants such as NOx.