Low error operation of a 4 stage single flux quantum shift register built with Y-Ba-Cu-O bicrystal Josephson junctions

Citation
Jh. Park et al., Low error operation of a 4 stage single flux quantum shift register built with Y-Ba-Cu-O bicrystal Josephson junctions, IEEE APPL S, 11(1), 2001, pp. 625-628
Citations number
11
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
1051-8223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
1
Pages
625 - 628
Database
ISI
SICI code
1051-8223(200103)11:1<625:LEOOA4>2.0.ZU;2-Q
Abstract
We fabricated a 4 stage single flux quantum shift register with YBa2Cu3Ox ( YBCO) bicrystal Josephson junctions and demonstrated the circuit's low erro r operation by using a computer controlled digital measurement set-up, The circuit was operated at 65 K, Binary data sequences of "1000", "1010", "101 1," and "1111" were successfully loaded and shifted in the circuit. The two read SQUIDs placed next to each side of the shift register were used to se nse all the individual data states. By operating the circuit with the prope r current pulses, we observed no errors during 16 hours, which is equivalen t to 21,000 error-free data shifts, We also found that temperature dependen t inductance and junction critical currents limit the operating temperature range of the circuit, and the effective thermal noise temperature can be l ower than 100 K.