Relationship between the surface resistance and crystal orientation of YBa2Cu3O7-delta thin film

Citation
S. Ohshima et al., Relationship between the surface resistance and crystal orientation of YBa2Cu3O7-delta thin film, IEEE APPL S, 11(1), 2001, pp. 3493-3496
Citations number
8
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
1051-8223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
3
Pages
3493 - 3496
Database
ISI
SICI code
1051-8223(200103)11:1<3493:RBTSRA>2.0.ZU;2-P
Abstract
We have examined the relationship between in-plane orientation, grain size, fluctuation of grain axis and surface resistance of YBa2Cu3O7-delta (YBCO) films. The surface resistance of YBCO films with a mixture of (100) and (1 10) in-plane grains was larger than that of the films with perfect in-plane orientation. The behavior of surface resistance could be explained by the degree of grain boundaries of (100) and (110) in-plane orientation. The sur face resistance of YBCO films was proportion to the fluctuation of grain ax is. It was also proven that surface resistance of high-temperature supercon ductors is affected by the critical current.