Precision and accuracy of surface resistance measurement with the dielectric resonator method

Citation
H. Obara et al., Precision and accuracy of surface resistance measurement with the dielectric resonator method, IEEE APPL S, 11(1), 2001, pp. 3074-3077
Citations number
3
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
1051-8223 → ACNP
Volume
11
Issue
1
Year of publication
2001
Part
3
Pages
3074 - 3077
Database
ISI
SICI code
1051-8223(200103)11:1<3074:PAAOSR>2.0.ZU;2-I
Abstract
The surface resistance of high-T-c superconducting films at microwave frequ encies was measured by the dielectric resonator method using two sapphire r ods, The dielectric resonator method is appropriate for the standard measur ement of surface resistance at microwave frequencies. We focused on several sources of error in this method, i.e., temperature inhomogeneity in the re sonator, asymmetry in coupling and the parasitic coupling effect, and discu ssed the precision and accuracy of the measurements, It was found that para sitic coupling is the main source of measurement error and we proposed seve ral types of resonators to eliminate the parasitic coupling. These results were reflected in the working draft of the International Electrotechnical C ommission Technical Committee 90(IEC/TTC90).