Vector magnetization imaging in ferromagnetic thin films using soft x-rays

Citation
Sk. Kim et al., Vector magnetization imaging in ferromagnetic thin films using soft x-rays, APPL PHYS L, 78(18), 2001, pp. 2742-2744
Citations number
25
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
0003-6951 → ACNP
Volume
78
Issue
18
Year of publication
2001
Pages
2742 - 2744
Database
ISI
SICI code
0003-6951(20010430)78:18<2742:VMIIFT>2.0.ZU;2-9
Abstract
A magnetization vector M imaging using a transmission x-ray microscope with magnetic circular dichroism (MCD) contrast is demonstrated. MCD images thr ough a semitransparent, 33-nm-thick Fe film are measured at the Fe L-3 edge along three different x-ray propagation directions to determine all three components of the M. The transmission images clearly display the vector nat ure of complex microstructures, associated with the M reversal between oppo sitely oriented 180 degrees domains, including not only 90 degrees domains, a Neel wall-like structure, and an extended ripple structure, but also a s triking feature of localized magnetization spirals with perpendicular compo nents at their cores. These studies have important implications for applica tions of this technique to better understand the expected features as well as details of domain-wall structures. (C) 2001 American Institute of Physic s.