Reduction of irreversibility in the first charge of tin oxide thin film negative electrodes

Citation
Sc. Nam et al., Reduction of irreversibility in the first charge of tin oxide thin film negative electrodes, J ELCHEM SO, 148(3), 2001, pp. A220-A223
Citations number
11
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Physical Chemistry/Chemical Physics","Material Science & Engineering
Journal title
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
ISSN journal
0013-4651 → ACNP
Volume
148
Issue
3
Year of publication
2001
Pages
A220 - A223
Database
ISI
SICI code
0013-4651(200103)148:3<A220:ROIITF>2.0.ZU;2-D
Abstract
Sputter deposited 3000 Angstrom tin oxide thin films into which metallic li thium (6000 Angstrom) was reacted were studied to develop a new negative el ectrode for thin firm rechargeable lithium batteries. The crystal structure and chemical composition of the lithium reacted tin oxide alms were charac terized by X-ray diffraction (XRD) analysis and Auger electron spectroscopy , respectively. The charge/discharge performances of these films exhibited capacities >400 mAh/g for >75 cycles. There was no irreversible plateau nea r 0.8 V vs. Li/Li+ due to reduction of SnO2 to Sn and Li2O during the first charge half-cycle. XRD and scanning transmission electron microscopy resul ts suggest that the Lithium-reacted tin oxide thin film consists of metalli c tin, lithium oxide, and reduced tin oxide, and the reacted thin films sho w reduced microcracks created by density fluctuations. (C) 2001 The Electro chemical Society. All rights reserved.