Application of ion beam techniques for preparation of metal ion-implanted TiO2 thin film photocatalyst available under visible light irradiation: Metal ion-implantation and ionized cluster beam method
H. Yamashita et al., Application of ion beam techniques for preparation of metal ion-implanted TiO2 thin film photocatalyst available under visible light irradiation: Metal ion-implantation and ionized cluster beam method, J SYNCHROTR, 8, 2001, pp. 569-571
Transparent TiO2 thin film photocatalysts have been prepared on silica glas
s plate by an Ionized Cluster Beam (ICB) method. In order to improve the el
ectronic properties of these photocatalysts, transition metal ions (V+, Cr, Mn+, Fe+) were implanted into the TiO2 thin films at high energy accelera
tion using an advanced metal ion-implantation technique. The combination of
these ion beam techniques can allow us to prepare the TiO2 thin film photo
catalysts which can work effectively under visible light (lambda >450 nm) a
nd/or solar light irradiation. The investigation using XAFS and ab initio m
olecular calculation suggests that the substitution of octahedrally coordin
ated Ti ions in TiO2 lattice with implanted metal ions is important to modi
fy TiO2 to be able to adsorb visible light and operate under visible light
irradiation.