Synchronous scanning of undulator gap and monochromator for XAFS measurements in soft x-ray region

Citation
T. Tanaka et al., Synchronous scanning of undulator gap and monochromator for XAFS measurements in soft x-ray region, J SYNCHROTR, 8, 2001, pp. 345-347
Citations number
6
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF SYNCHROTRON RADIATION
ISSN journal
0909-0495 → ACNP
Volume
8
Year of publication
2001
Part
2
Pages
345 - 347
Database
ISI
SICI code
0909-0495(200103)8:<345:SSOUGA>2.0.ZU;2-D
Abstract
Synchronous scanning of the undulator gap and a monochromator was done to o btain smooth profiles of incident x-rays that are suitable for XAFS measure ments. By changing the gap from 150 mm (B=0.12 T) to 140 mm (B=0.15 T) with the use of the 3(rd) to 11(th) harmonic peaks, soft x-rays with energy fro m 200 eV to 1200 eV were obtained. The smooth profile of the incident x-ray s provided high-quality measurement of XANES and EXAFS spectra in the soft x-ray region. Issues that would improve the synchronous scanning system are discussed.