Two-color reflection multilayers for He-I and He-II resonance lines for microscopic ultraviolet photoelectron spectroscopy using Schwarzschild objective

Citation
T. Ejima et al., Two-color reflection multilayers for He-I and He-II resonance lines for microscopic ultraviolet photoelectron spectroscopy using Schwarzschild objective, JPN J A P 1, 40(1), 2001, pp. 376-379
Citations number
10
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
1
Year of publication
2001
Pages
376 - 379
Database
ISI
SICI code
0021-4922(200101)40:1<376:TRMFHA>2.0.ZU;2-F
Abstract
Two-color multilayers reflecting both He-I (58.4 nm) and He-II (30.4 nm) re sonance lines have been designed and fabricated as reflection coatings of m irrors of Schwarzschild objectives used for microscopic ultraviolet photoel ectron spectrometers. The multilayer was designed to consist of a top singl e layer and piled double layers so that its normal incidence reflectances f or both He-I and He-II resonance lines are more than 20%. Multilayers of Si C(top layer)-Mg/SiC(double layers) and SiC(top layer)-Y2O3/Mg (double layer s) are fabricated, and their reflectances for the He-I and He-II lines are 25% and 20%, and 23% and 26%, respectively.