Measurement of the dc Kerr and electrostrictive phase modulation in silica

Liu, AC Digonnet, MJF Kino, GS

Ac. Liu et al., Measurement of the dc Kerr and electrostrictive phase modulation in silica, J OPT SOC B, 18(2), 2001, pp. 187-194

32

INGLESE

Article

Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS

0740-3224 → ACNP

18

2

2001

187 - 194

ISI

0740-3224(200102)18:2<187:MOTDKA>2.0.ZU;2-A

We report, to our knowledge, the first polarization-resolved measurement of the frequency dependence of both the electronic and the electrostrictive c ontributions to the de Kerr coefficient in silica. At the acoustic resonanc e the perpendicular polarization phase shift is a factor of 2.3 times great er than in the parallel polarization, confirming the presence of strong ele ctrostriction. We find good agreement between the phase-shift measurements and theoretical models of both the polarization and frequency dependence. T he analysis indicates the de Kerr coefficient chi ((3))(1111)(omega; omega, 0, 0) to be 1.9 x 10(-22) m(2)/V-2. From these results the electrostrictiv e contribution to a poled-silica device near the device acoustic resonance is expected to be r(33,Es) = 28 pm/V, over an order of magnitude greater th an the electronic Kerr electro-optic coefficient r(33,Kerr) = 0.2 pm/V. (C) 2001 Optical Society of America OCIS codes: 190.3270, 160.2750, 160.6030, 190.0190, 230.2090.