Ultrahigh vacuum cantilever magnetometry with standard size single crystalsubstrates

Citation
T. Hopfl et al., Ultrahigh vacuum cantilever magnetometry with standard size single crystalsubstrates, REV SCI INS, 72(2), 2001, pp. 1495-1501
Citations number
34
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
0034-6748 → ACNP
Volume
72
Issue
2
Year of publication
2001
Pages
1495 - 1501
Database
ISI
SICI code
0034-6748(200102)72:2<1495:UVCMWS>2.0.ZU;2-I
Abstract
A cantilever magnetometer is described that measures the magnetic moment of ferromagnetic films with submonolayer sensitivity. The magnetometer is inc orporated into an ultrahigh vacuum chamber for sample preparation and in si tu magnetometry. Standard size single crystals of 5 mm diameter and 2 mm th ickness can be used, which are mounted on thin sheet metal. This composite sampleholder works as a cantilever when the bending is induced by the torqu e exerted by an external magnetic field on a monolayer ferromagnetic film d eposited onto the single crystal substrate. We demonstrate the submonolayer sensitivity on Fe monolayers on Cu(100) in the thickness range from 2 to 6 8 monolayers. The sample holder is designed for internal calibration by pas sing a current through it and exploiting the well-known current induced mag netic moment. (C) 2001 American Institute of Physics.