X-ray absorption spectral analyses by theoretical calculations for TiO2 and Ni-doped TiO2 thin films on glass plates

Citation
S. Matsuo et al., X-ray absorption spectral analyses by theoretical calculations for TiO2 and Ni-doped TiO2 thin films on glass plates, ANAL SCI, 17(1), 2001, pp. 149-153
Citations number
40
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ANALYTICAL SCIENCES
ISSN journal
0910-6340 → ACNP
Volume
17
Issue
1
Year of publication
2001
Pages
149 - 153
Database
ISI
SICI code
0910-6340(200101)17:1<149:XASABT>2.0.ZU;2-3
Abstract
Ni L- and Ti L-edge as well as Ti K-edge X-ray absorption experiments for T iO2 thin films and Ni-doped TiO2 thin films coated on glass plates were per formed using synchrotron radiation to investigate the structures around Ni and Ti ions in the films. The obtained spectra were compared with the resul ts of theoretical calculations. It has consequently been found that the spe ctral features were affected by a change in the oxidizing form of Ni ions d ue to hydrogen reduction, by the charge variation and/or slight orbital spl itting of Ti ions, and by the magnitude of the interaction between the cent er Ti ion and neighboring Ti ions.