Polarized differential-phase laser scanning microscope

Citation
C. Chou et al., Polarized differential-phase laser scanning microscope, APPL OPTICS, 40(1), 2001, pp. 95-99
Citations number
12
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
0003-6935 → ACNP
Volume
40
Issue
1
Year of publication
2001
Pages
95 - 99
Database
ISI
SICI code
0003-6935(20010101)40:1<95:PDLSM>2.0.ZU;2-G
Abstract
A polarized differential-phase laser scanning microscope, which combines a polarized optical heterodyne Mach-Zehnder interferometer and a differential amplifier to scan the topographic image of a surface, is proposed. In the experiment the differential amplifier, which acts as a PM-AM converter in t he experiment, converting phase modulation (PM) into amplitude modulation ( AM). Then a novel, to our knowledge, phase demodulator was proposed and imp lemented for the differential-phase laser scanning microscope. An optical g rating (1800 1p/mm) was imaged. The lateral and the depth resolutions of th e imaging system were 0.5 mum and 1 nm, respectively. The detection accurac y, which was limited by the reflectivity variation of the test surface, is discussed. (C) 2001 Optical Society of America OCIS codes: 120.3180, 120.39 40, 180.3170, 180.5810, 120.2130, 120.2830.