Characteristics of YBa2Cu3O7-y Josephson junctions prepared with smooth ramp-edge surfaces

Citation
Lm. Wang et al., Characteristics of YBa2Cu3O7-y Josephson junctions prepared with smooth ramp-edge surfaces, PHYSICA C, 341, 2000, pp. 2729-2730
Citations number
5
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
0921-4534 → ACNP
Volume
341
Year of publication
2000
Part
4
Pages
2729 - 2730
Database
ISI
SICI code
0921-4534(200011)341:<2729:COYJJP>2.0.ZU;2-P
Abstract
YBa2Cu3O7-y ramp-type Josephson junctions with PrBa2Cu3O7-y and SrTiO3 barr iers have been fabricated on SrTiO4 (001) substrates. The surface morpholog y of the ramp-edge was examined using the atomic force microscope (AFM). Th e conditions of the photolithography process and the ion beam incident angl e were optimized to improve the surface roughness at the ramp edge. Typical ly, smooth surfaces at the ramp-edge with a ramp angle of about 25 degrees and an average roughness of about 3 nm was achieved. Results indicate the j unction properties are improved with a smooth ramp-edge surface. The detail s are discussed.