Spectroscopy of single metallic nanoparticles using total internal reflection microscopy

Citation
C. Sonnichsen et al., Spectroscopy of single metallic nanoparticles using total internal reflection microscopy, APPL PHYS L, 77(19), 2000, pp. 2949-2951
Citations number
17
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
0003-6951 → ACNP
Volume
77
Issue
19
Year of publication
2000
Pages
2949 - 2951
Database
ISI
SICI code
0003-6951(20001106)77:19<2949:SOSMNU>2.0.ZU;2-W
Abstract
We have developed a simple, fast, and flexible technique to measure optical scattering spectra of individual metallic nanoparticles. The particles are placed in an evanescent field produced by total internal reflection of lig ht from a halogen lamp in a glass prism. The light scattered by individual particles is collected using a conventional microscope and is spectrally an alyzed by a nitrogen-cooled charge-coupled-device array coupled to a spectr ometer. This technique is employed to measure the effect of particle diamet er on the dephasing time of the particle plasmon resonance in gold nanopart icles. We also demonstrate the use of this technique for measurements in li quids, which is important for the potential application of particle plasmon s in chemical or biological nanosensors. (C) 2000 American Institute of Phy sics. [S0003-6951(00)01745-9].