Probe station testing of large area silicon drift detectors

Citation
A. Asmus et al., Probe station testing of large area silicon drift detectors, IEEE NUCL S, 47(4), 2000, pp. 1375-1380
Citations number
12
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
0018-9499 → ACNP
Volume
47
Issue
4
Year of publication
2000
Part
1
Pages
1375 - 1380
Database
ISI
SICI code
0018-9499(200008)47:4<1375:PSTOLA>2.0.ZU;2-L
Abstract
Probe stations for STAR Silicon Drift Detectors testing were developed and built at BNL and Ohio State University. A throughput of a wafer per day per probe station was reached. Testing procedure and probe station design crit eria are discussed.