Measurement of high-intensity laser pulse widths by use of tunneling ionization of atoms and ions

Citation
M. Kakehata et al., Measurement of high-intensity laser pulse widths by use of tunneling ionization of atoms and ions, J OPT SOC B, 17(9), 2000, pp. 1490-1497
Citations number
19
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
ISSN journal
0740-3224 → ACNP
Volume
17
Issue
9
Year of publication
2000
Pages
1490 - 1497
Database
ISI
SICI code
0740-3224(200009)17:9<1490:MOHLPW>2.0.ZU;2-Z
Abstract
We measured the pulse duration of amplified Ti:sapphire laser pulses by usi ng the tunneling ionization of atoms and ions. Fringe-resolved autocorrelat ion signals with various effective nonlinear orders are measured by means o f counting the number of ions at different charge states by the time-of-fli ght (TOF) method. The measured pulse widths agree well with the independent ly measured pulse width if we consider the pulse distortion by a focusing l ens. Measurement of multiply charged ions by a TOF device is useful for ext ending the measurable intensity range and wavelength ranges. (C) 2000 Optic al Society of America [S0740-3224(00)01309-6].