Characterization of optogeometric parameters of optical fibers by near-field scanning probe microscopies

Citation
C. Chicanne et al., Characterization of optogeometric parameters of optical fibers by near-field scanning probe microscopies, J OPT SOC B, 17(9), 2000, pp. 1473-1482
Citations number
25
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS
ISSN journal
0740-3224 → ACNP
Volume
17
Issue
9
Year of publication
2000
Pages
1473 - 1482
Database
ISI
SICI code
0740-3224(200009)17:9<1473:COOPOO>2.0.ZU;2-H
Abstract
The combination of atomic-force and scanning-near-field optical microscopie s is useful for characterizing the physical and optical parameters of optoe lectronic devices. With a commercial atomic-force microscope adapted, to pe rform scanning-near-field optical measurements, we succeed in determining c ore diameters, localizing the erbium doping zone, and analyzing propagation modes in erbium-doped and multimodal optical fibers. (C) 2000 Optical Soci ety of America [S0740-3224(00)00809-2].