Oscillatory electron-phonon coupling in ultra-thin silver films on V(100)

Citation
T. Valla et al., Oscillatory electron-phonon coupling in ultra-thin silver films on V(100), J PHYS-COND, 12(28), 2000, pp. L477-L482
Citations number
20
Language
INGLESE
art.tipo
Letter
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF PHYSICS-CONDENSED MATTER
ISSN journal
0953-8984 → ACNP
Volume
12
Issue
28
Year of publication
2000
Pages
L477 - L482
Database
ISI
SICI code
0953-8984(20000717)12:28<L477:OECIUS>2.0.ZU;2-P
Abstract
The temperature dependence of peak widths in high-resolution angle-resolved photoelectron spectroscopy from quantum well states in ultra-thin Ag films on V(100) has been used to determine the electron-phonon coupling constant , lambda, for films of thickness 1-8 layers. A strong oscillatory variation in coupling strength is observed as a function of film thickness, peaking at a two layer film for which lambda similar or equal to 1.0. A simple theo ry incorporating interaction of the photo-hole with the thermal vibrations of the potential step at the adlayer-vacuum interface is shown to reproduce the main features of these results.