Crystal structure of GeTe and Ge2Sb2Te5 meta-stable phase

Citation
T. Nonaka et al., Crystal structure of GeTe and Ge2Sb2Te5 meta-stable phase, THIN SOL FI, 370(1-2), 2000, pp. 258-261
Citations number
9
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
0040-6090 → ACNP
Volume
370
Issue
1-2
Year of publication
2000
Pages
258 - 261
Database
ISI
SICI code
0040-6090(20000717)370:1-2<258:CSOGAG>2.0.ZU;2-1
Abstract
Direct X-ray diffraction measurement of the erased state of the Ge-Sb-Te re cording layer in a four-layered phase change optical disk, which was produc ed by an optical disk drive, was performed. It was identified as an fee cry stal structure. In order to carry out the detailed crystal structure analys is by the powder X-ray diffraction method with Rietveld refinements, somewh at larger amount of the fee crystal powder was prepared from deposited 10 m u m thick films, It revealed that Ge2Sb2Te5 belongs to the NaCl type struct ure (Fm (3) over bar m) with the 4a site including 20% vacancies. The concl usion was supported by the results of the density measurements with Grazing Incidence of X-ray Reflectivity. (C) 2000 Elsevier Science S.A. All rights reserved.