Fabrication of low surface resistance YBCO films and its application to microwave devices

Citation
S. Ohshima et al., Fabrication of low surface resistance YBCO films and its application to microwave devices, PHYSICA C, 335(1-4), 2000, pp. 207-213
Citations number
10
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
0921-4534 → ACNP
Volume
335
Issue
1-4
Year of publication
2000
Pages
207 - 213
Database
ISI
SICI code
0921-4534(200006)335:1-4<207:FOLSRY>2.0.ZU;2-Q
Abstract
We have examined a fabrication process of low surface resistance (Rs) YBa2C u3O7-delta (YBCO) films on CeO2/Al2O3 substrates by a laser ablation techni que. The surface morphology of CeO2 films depended on the film thickness of CeO2. A critical value of the CeO2 film thickness at similar to 90 nm was found above which the surface roughness increased abruptly. The Rs of YBCO films also depended on the surface morphology of CeO2 films. The Rs value o f YBCO films on thinner CeO2 films (< 90 nm) was quite smaller than that of YBCO films on thicker CeO2 films (> 90 nm). We have also examined the high -temperature superconducting (HTS) antenna as one of the HTS passive device s, and measured the power handling capability. The compact cooling system f or HTS patch antenna was constructed. (C) 2000 Elsevier Science B.V. All ri ghts reserved.