Effect of different elementary processes on the breakdown in low-pressure helium gas

Citation
P. Hartmann et al., Effect of different elementary processes on the breakdown in low-pressure helium gas, PLASMA SOUR, 9(2), 2000, pp. 183-190
Citations number
48
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Physics
Journal title
PLASMA SOURCES SCIENCE & TECHNOLOGY
ISSN journal
0963-0252 → ACNP
Volume
9
Issue
2
Year of publication
2000
Pages
183 - 190
Database
ISI
SICI code
0963-0252(200005)9:2<183:EODEPO>2.0.ZU;2-S
Abstract
We investigated the breakdown in low-pressure helium gas both experimentall y and by computer simulations. At low breakdown voltages (V-BR less than or equal to 1000 V) the experimental and simulation results show a good agree ment (differences are within 20%), while at higher voltages the simulations and experiments agree qualitatively. Our simulations indicate that several processes contribute to the particular shape of the Paschen curve in heliu m at low pressures. These processes are: (1) the dependence of the lion-ind uced) secondary electron emission yield on the ion energy, (2) the appearan ce of ion impact ionization of the gas at high electric fields and (3) the secondary electron emission from the cathode due to fast neutral atoms.