Structure of an InAs(111)A-(2X2)S surface studied by scanning tunneling microscopy, photoelectron spectroscopy, and X-ray photoelectron diffraction

Citation
S. Ichikawa et al., Structure of an InAs(111)A-(2X2)S surface studied by scanning tunneling microscopy, photoelectron spectroscopy, and X-ray photoelectron diffraction, PHYS REV B, 61(19), 2000, pp. 12982-12987
Citations number
24
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
0163-1829 → ACNP
Volume
61
Issue
19
Year of publication
2000
Pages
12982 - 12987
Database
ISI
SICI code
0163-1829(20000515)61:19<12982:SOAISS>2.0.ZU;2-1
Abstract
The structure of an InAs(111)A-(2 X 2)S surface has been studied by using s canning tunneling microscopy (STM), synchrotron radiation photoemission spe ctroscopy (SRPES), and x-ray photoelectron diffraction (XPD). Honeycomblike images are observed by STM measured at a bias voltage of -1.4 V. Similar i mages are also observed at + 1.5 V, although the intensity of the alternati ve corner of a hexagon is depressed, resulting in a threefold symmetry. S 2 s and As 3d XPD patterns show that sulfur atoms rarely exchange the fourfol d arsenic sites. Three surface components are found in the In 4d spectra. O n the other hand, no surface components are found in the As 3d spectra. Bas ed on the STM, SRPES, and XPD results, a probable structure model for the ( 2 X 2)S surface is proposed. The experimental XPD patterns are in good agre ement with the calculated ones.