X-ray photoelectron spectroscopy of sodium aluminosilicate glasses

Citation
Y. Miura et al., X-ray photoelectron spectroscopy of sodium aluminosilicate glasses, PHYS C GLAS, 41(1), 2000, pp. 24-31
Citations number
28
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
PHYSICS AND CHEMISTRY OF GLASSES
ISSN journal
0031-9090 → ACNP
Volume
41
Issue
1
Year of publication
2000
Pages
24 - 31
Database
ISI
SICI code
0031-9090(200002)41:1<24:XPSOSA>2.0.ZU;2-0
Abstract
X-ray photoelectron spectra of Na2O Al2O3-SiO2 glasses were measured by a m onochromatised Al-k alpha XPS instrument with a novel charge control method Chemical shifts of cove level photoelectron spectra of the glass constitue nt ions were investigated with glass composition with respect to the extern al energy reference of Au 4f(7/2). Peaks at higher and lower energy sides o f the Ols signal were observed and they were ascribed to bridging oxide (BO ) and nonbridging oxide (NBO) components, respectively The BO component was successfully separated into two parts: Si-O Si (BO(1)) and Al-O-Si (BO(2)) . The compositional change for the relative amount of the three O1s compone nts follows an equation derived from an assumption that all aluminium ions were four-coordinated. The Na1s signal could not be separated into two comp onents of Na+ ions associated with [AlO4/2](-) tetrahedra and NBOs. However , the Na1s chemical shift reflected the change in the bonding characteristi cs of Na+ ions in the glasses.