Forward scattering peaks of ion-induced Anger electrons

Citation
H. Kudo et al., Forward scattering peaks of ion-induced Anger electrons, NUCL INST B, 159(4), 1999, pp. 241-247
Citations number
17
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168-583X → ACNP
Volume
159
Issue
4
Year of publication
1999
Pages
241 - 247
Database
ISI
SICI code
0168-583X(199912)159:4<241:FSPOIA>2.0.ZU;2-C
Abstract
We have investigated availability of fast ion beams for observing the forwa rd scattering effect of Auger electrons emitted from a crystal surface. The angle-resolved patterns of Si KLL-Auger electrons (similar to 1.6 keV) ind uced by 12 MeV He2+ exhibited clear crystallographic symmetry including enh anced intensities in the [100] and [111] directions. The results demonstrat e applicability of the angle-resolved spectroscopy of ion-induced Auger ele ctrons to structural analysis of surfaces and interfaces. (C) 1999 Elsevier Science B.V. All rights reserved.