Ellipsometric spectra and optical constants of PLZT thin films

Citation
D. Mo et al., Ellipsometric spectra and optical constants of PLZT thin films, FERROELECTR, 229(1-4), 1999, pp. 123-130
Citations number
13
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
FERROELECTRICS
ISSN journal
0015-0193 → ACNP
Volume
229
Issue
1-4
Year of publication
1999
Pages
123 - 130
Database
ISI
SICI code
0015-0193(1999)229:1-4<123:ESAOCO>2.0.ZU;2-U
Abstract
Lead lanthanum zirconate titanate (PLZT) amorphous films with composition 9 /65/35 were prepared by the sol-gel technique. The ellipsometric spectra of the PLZT films on Si substrates were measured in the wavelength range of 2 00-700nm. By analyzing the ellipsometric spectra, the optical constant (ref ractive index n and extinction coefficient k) spectra of the PLZT amorphous films were obtained. We also measured the ellipsometric spectra of PLZT ce ramics with the same composition and compared the results of the amorphous films with those of the ceramics. In comparison with the ceramics, the abso rption edge of the PLZT amorphous films was found to be at a shorter wavele ngth.