Chemical analysis of grain boundaries using intense electron beams

Citation
P. Shang et al., Chemical analysis of grain boundaries using intense electron beams, PHIL MAG A, 79(10), 1999, pp. 2539-2552
Citations number
21
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS ANDMECHANICAL PROPERTIES
ISSN journal
1364-2804 → ACNP
Volume
79
Issue
10
Year of publication
1999
Pages
2539 - 2552
Database
ISI
SICI code
1364-2804(199910)79:10<2539:CAOGBU>2.0.ZU;2-D
Abstract
Scanning transmission electron microscopy-energy dispersive X-ray analysis line scans and mapping have been used to examine the large-angle grain-boun dary chemistry of nickel-rich Ni3Al both with and without boron. The result s suggest that the aluminium content is reduced while the nickel content is unchanged at the grain boundaries in all these alloys, with the percentage of reduction in aluminium at the grain boundaries decreasing as the boron concentration increases. There is a strong likelihood that radiation damage is influencing or controlling the measured profiles.